Layer-resolved ultrafast extreme ultraviolet measurement of hole transport in a Ni-TiO 2 -Si photoanode
Abstract
Ultrafast charge carrier migration through all the layers of a nanojunction is observed and quantified.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 03, 2020
- Source ID
- 10.1126/sciadv.aay6650
Entities
People
- Angela Lee
- Bethany R de Roulet
- Brett Marsh
- Ilana Porter
- Mihai E Vaida
- Scott K Cushing
- Stephen R. Leone
- Szilard Szoke
Organizations
- Air Force Office of Scientific Research
- California Institute of Technology
- Lawrence Berkeley National Laboratory
- United States Department of Energy
- University of Central Florida
- Yusuf Hamied Department of Chemistry