Metallic line defect in wide-bandgap transparent perovskite BaSnO 3

Abstract

A metallic line defect is found in wide-bandgap perovskite oxide thin films.

Document Details

• Document Type: Pub Defense Publication
• Publication Date: Jan 15, 2021
• Source ID: 10.1126/sciadv.abd4449

Entities

People

• Abhinav Prakash
• Andre Mkhoyan
• Bharat Jalan
• Hwanhui Yun
• Jong S Jeong
• Mehmet Topsakal
• Turan Birol

Organizations

• Air Force Office of Scientific Research
• Argonne National Laboratory
• Brookhaven National Laboratory
• National Science Foundation
• Semiconductor Research Corporation
• University of Chicago
• University of Minnesota