Dynamic thermal management for FinFET-based circuits exploiting the temperature effect inversion phenomenon

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 11, 2014
Source ID
10.1145/2627369.2627608

Entities

People

  • Massoud Pedram
  • Shahin Nazarian
  • Tiansong Cui
  • Woojoo Lee
  • Yanzhi Wang

Organizations

  • Defense Advanced Research Projects Agency
  • Semiconductor Research Corporation
  • University of Southern California