Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 05, 2016
Source ID
10.1145/2897937.2898072

Entities

People

  • Arkadiy Morgenshtein
  • Avi Ziv
  • Doowon Lee
  • Ronny Morad
  • Tom Kolan
  • Valeria Bertacco
  • Vitali Sokhin

Organizations

  • Defense Advanced Research Projects Agency
  • IBM Research
  • Semiconductor Research Corporation
  • University of Michigan