Voltage-based electromigration immortality check for general multi-branch interconnects

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 07, 2016
Source ID
10.1145/2966986.2967083

Entities

People

  • Ertugrul Demircan
  • Mehul D. Shrof
  • Sheldon X.-D. Tan
  • Taeyoung Kim
  • Xin Huang
  • Zeyu Sun

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation
  • Semiconductor Research Corporation
  • University of California