Dynamic reliability management for near-threshold dark silicon processors

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 07, 2016
Source ID
10.1145/2966986.2980080

Entities

People

  • Chase Cook
  • Hai Wang
  • Haibao Chen
  • Jagadeesh Gaddipati
  • Sheldon X.-D. Tan
  • Taeyoung Kim
  • Zeyu Sun

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation
  • Semiconductor Research Corporation
  • Shanghai Jiao Tong University
  • University of California
  • University of Electronic Science and Technology of China