Lightweight Architectures for Reliable and Fault Detection Simon and Speck Cryptographic Algorithms on FPGA
Abstract
The widespread use of sensitive and constrained applications necessitates lightweight (low-power and low-area) algorithms developed for constrained nano-devices. However, nearly all of such algorithms are optimized for platform-based performance and may not be useful for diverse and flexible applications. The National Security Agency (NSA) has proposed two relatively recent families of lightweight ciphers, that is, Simon and Speck, designed as efficient ciphers on both hardware and software platforms. This article proposes concurrent error detection schemes to provide reliable architectures for these two families of lightweight block ciphers. The research work on analyzing the reliability of these algorithms and providing fault diagnosis approaches has not been undertaken to date to the best of our knowledge. The main aim of the proposed reliable architectures is to provide high error coverage while maintaining acceptable area and power consumption overheads. To achieve this, we propose a variant of recomputing with encoded operands. These low-complexity schemes are suited for low-resource applications such as sensitive, constrained implantable and wearable medical devices. We perform fault simulations for the proposed architectures by developing a fault model framework. The architectures are simulated and analyzed on recent field-programmable grate array (FPGA) platforms, and it is shown that the proposed schemes provide high error coverage. The proposed low-complexity concurrent error detection schemes are a step forward toward more reliable architectures for Simon and Speck algorithms in lightweight, secure applications.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- May 11, 2017
- Source ID
- 10.1145/3055514
Entities
People
- Mehran Mozaffari-kermani
- Prashant Ahir
- Reza Azarderakhsh
Organizations
- Florida Atlantic University
- National Institute of Standards and Technology
- Rochester Institute of Technology
- United States Army Research Laboratory
- United States Department of Commerce