Defect States Determining Dynamic Trapping-Detrapping in β-Ga2O3 Field-Effect Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2019
Source ID
10.1149/2.0031907jss

Entities

People

  • A. Y. Polyakov
  • Fan Ren
  • I. Shchemerov
  • Jihyun Kim
  • N. B. Smirnov
  • Sergey V. Chernykh
  • Sooyeoun Oh
  • Stephen Pearton
  • А. I. Kochkova

Organizations

  • Defense Threat Reduction Agency
  • Ministry of Education and Science of the Russian Federation
  • National Research Foundation of Korea