Simulation of Deep-Level Trap Distributions in AlGaN/GaN HEMTs and Its Influence on Transient Analysis of Drain Current

Document Details

Document Type: Pub Defense Publication
Publication Date: Jan 01, 2017
Source ID: 10.1149/2.0211711jss

Entities

People

E. E. Patrick
Mark E. Law
S. Mukherjee

Organizations

Defense Threat Reduction Agency