Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films
Abstract
Infrared optical properties of spin-cast chitosan films have been determined using spectroscopic ellipsometry. Infrared index of refraction and extinction coefficients from 750 cm–1to 4000 cm–1were determined using ellipsometric data fits to dispersion models based on Gaussian shaped oscillators. The free electron contribution was analyzed using a Drude model. This modeling determined that optical anisotropy was present over the entire infrared region. Line shape and oscillator strength analysis was performed to determine oscillator strengths, abundance, and relative bond strength.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2005
- Source ID
- 10.1155/2005/498649
Entities
People
- A. Subramanian
- D.w. Thompson
- J.a. Woollam
- Suman Sarkar
- W.h. Nosal
Organizations
- United States Army Research Laboratory
- University of Nebraska–Lincoln