Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities
Abstract
Interest in single-ion implantation is driven in part by research into development of solid-state devices that exhibit quantum behaviour in their electronic or optical characteristics. Here, we provide an overview of international research work on single ion implantation and single ion detection for development of electronic devices for quantum computing. The scope of international research into single ion implantation is presented in the context of our own research in the Centre for Quantum Computation and Communication Technology in Australia. Various single ion detection schemes are presented, and limitations on dopant placement accuracy due to ion straggling are discussed together with pathways for scale-up to multiple quantum devices on the one chip. Possible future directions for ion implantation in quantum computing and communications are also discussed.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2012
- Source ID
- 10.1155/2012/272694
Entities
People
- Andrew D. Alves
- Brett C Johnson
- Changyi Yang
- David N. Jamieson
- Jeffrey McCallum
- Jessica A. Van Donkelaar
- Samuel C. Thompson
- Toby Hopf
Organizations
- Army Research Office
- University of Melbourne