The MEAM parameter calibration tool: an explicit methodology for hierarchical bridging between ab initio and atomistic scales

Document Details

Document Type
Pub Defense Publication
Publication Date
May 06, 2016
Source ID
10.1186/s40192-016-0051-6

Entities

People

  • Christopher D Barrett
  • Ricolindo L. Carino

Organizations

  • Engineer Research and Development Center