Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 18, 2019
Source ID
10.1364/ao.58.000d28

Entities

People

  • Alex Jen
  • David J Hagan
  • Eric W. Van Stryland
  • Honghua Hu
  • Joel M. Hales
  • Joseph W Perry
  • Sei-hum Jang
  • Sepehr Benis
  • Trenton R Ensley
  • Zhong'an Li

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • United States Army Research Laboratory