Ellipsometry: dielectric functions of anisotropic crystals and symmetry
Abstract
The optical functions of anisotropic materials can be determined using generalized ellipsometry, which can measure the cross-polarization coefficients (CPs) of the sample surface reflections. These CPs have several symmetry relations with respect to the symmetry of the crystal. This paper explores the symmetry relations of these CPs for uniaxial, orthorhombic, and monoclinic crystals and the requirements for generalized ellipsometry. Several ellipsometry measurement configurations are examined, including the requirements for the accurate measurements of the dielectric functions of anisotropic crystals.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 14, 2022
- Source ID
- 10.1364/josaa.471958
Entities
People
- Ambalanath Shan
- Gerald E. Jellison
- Nikolas J. Podraza
Organizations
- Air Force Research Laboratory
- Oak Ridge National Laboratory
- Office of Nuclear Energy
- University of Toledo