Beam deflection measurement of bound-electronic and rotational nonlinear refraction in molecular gases: erratum

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 09, 2016
Source ID
10.1364/oe.24.019122

Entities

People

  • David J Hagan
  • Eric W. Van Stryland
  • Jennifer M. Reed
  • Matthew Reichert
  • Peng Zhao
  • Trenton R Ensley

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems