Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography
Abstract
Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, E ~ ( x , y , z , ω ) , can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, E ~ ( x , y , ω ) , from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 24, 2021
- Source ID
- 10.1364/oe.433752
Entities
People
- Bojana Ivanic
- Charles G. Durfee
- Daniel E Adams
- David Goldberger
- David Schmidt
- Jonathan Barolak
Organizations
- Air Force Office of Scientific Research
- Colorado School of Mines
- National Science Foundation