Contrast enhancement in near-infrared electro-optic imaging
Abstract
Access to subtle ultrafast effects of light-matter interaction often requires highly sensitive field detection schemes. Electro-optic sampling, being an exemplary technique in this regard, lacks high sensitivity in an imaging geometry. We demonstrate a straightforward method to significantly improve the contrast of electric field images in spatially resolved electro-optic sampling. A thin-film polarizer is shown to be an effective tool in enhancing the sensitivity of the electro-optic imaging system, enabling an adjustment of the spectral response. We show a further increase of the signal-to-noise ratio through the direct control of the carrier envelope phase of the imaged field.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- May 11, 2022
- Source ID
- 10.1364/oe.455413
Entities
People
- Enrico Ridente
- Matthew Weidman
- Mikhail Mamaikin
- Najd Altwaijry
- Nicholas Karpowicz
Organizations
- Air Force Office of Scientific Research
- Institute of Nanotechnology
- Ludwig-Maximilians-Universität München
- Max Planck Institute of Quantum Optics
- University of California