Extraction of silver losses at cryogenic temperatures through the optical characterization of silver-coated plasmonic nanolasers

Abstract

We report on the extraction of silver losses in the range 10 K-180 K by performing temperature-dependent micro-photoluminescence measurements in conjunction with numerical simulations on silver-coated nanolasers around near-infrared telecommunication wavelengths. By mapping changes in the quality factor of nanolasers into silver-loss variations, the imaginary part of silver permittivity is extracted at cryogenic temperatures. The latter is estimated to reach values an order of magnitude lower than room-temperature values. Temperature-dependent values for the thermo-optic coefficient of III-V semiconductors occupying the cavity are estimated as well. This data is missing from the literature and is crucial for precise device modeling. Our results can be useful for device designing, the theoretical validation of experimental observations as well as the evaluation of thermal effects in silver-coated nanophotonic structures.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2022
Source ID
10.1364/oe.458513

Entities

People

  • Aris Koulas-simos
  • Cun-Zheng Ning
  • Georgios Sinatkas
  • Jia-lu Xu
  • Mercedeh Khajavikhan
  • Qiang Kan
  • Ruikang Zhang
  • Stephan Reitzenstein
  • Taiping Zhang
  • William E. Hayenga

Organizations

  • Air Force Office of Scientific Research
  • Aristotle University of Thessaloniki
  • Arizona State University
  • Chinese Academy of Sciences
  • Defense Advanced Research Projects Agency
  • German Research Foundation
  • National Science Foundation
  • Office of Naval Research
  • Tsinghua University
  • University of Central Florida
  • University of Southern California

Tags

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Reinforced Composite Materials
  • Superconducting Magnet Technology

Technology Areas

  • Microelectronics