Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 12, 2009
Source ID
10.1364/ol.34.001906

Entities

People

  • F. González
  • F. Moreno
  • J. M. Saiz
  • J. M. Sanz
  • Pablo Albella

Organizations

  • Ministry of Science of Spain