Impact of surface roughness on the effective dielectric constants and subwavelength image resolution of metal–insulator stack lenses
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 12, 2012
- Source ID
- 10.1364/ol.37.004317
Entities
People
- Alon Ludwig
- Kevin J. Webb
- Shivanand
Organizations
- Army Research Office
- National Science Foundation
- United States Department of Energy