Spinning pupil aberration measurement for anisoplanatic deconvolution
Abstract
The aberrations in an optical microscope are commonly measured and corrected at one location in the field of view, within the so-called isoplanatic patch. Full-field correction is desirable for high-resolution imaging of large specimens. Here we present, to the best of our knowledge, a novel wavefront detector, based on pupil sampling with subapertures, measuring the aberrated wavefront phase at each position of the specimen. Based on this measurement, we propose a region-wise deconvolution that provides an anisoplanatic reconstruction of the sample image. Our results indicate that the measurement and correction of the aberrations can be performed in a wide-field fluorescence microscope over its entire field of view.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 14, 2021
- Source ID
- 10.1364/ol.427518
Entities
People
- Andrea Bassi
- Daniele Ancora
- Stefano Bonora
- Tommaso Furieri
Organizations
- Air Force Research Laboratory
- Consiglio Nazionale delle Ricerche
- Marie Skłodowska-Curie Actions
- Office of Naval Research Global
- Polytechnic University of Milan
- University of Padua