Optical dielectric constants of single crystalline silver films in the long wavelength range
Abstract
Optical dielectric constants are critical to modeling the electronic and optical properties of materials. Silver, as a noble metal with low loss, has been extensively investigated. The recently developed epitaxial growths of single crystalline Ag on dielectric substrates have prompted efforts to characterize their intrinsic optical dielectric function. In this paper, we report spectral ellipsometry measurements and analysis of a thick, epitaxially-grown, single-crystalline Ag film. We focus on the range of 0.18 – 1.0 eV or 1.24 – 7 µm, an energy and wavelength range that has not been examined previously using epitaxial films. We compare the extracted dielectric constants and the predicted optical performances with previous measurements. The loss is appreciably lower than the widely quoted Palik’s optical constants (i.e., up to a factor of 2) in the infrared frequency range. The improved knowledge of fundamental optical properties of the high-quality epitaxial Ag film will have a broad impact on simulations and practical applications based on Ag in the long wavelength range.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 31, 2020
- Source ID
- 10.1364/ome.385723
Entities
People
- Chandriker Kavir Dass
- Chih-Kang Shih
- Chun-yuan Wang
- Fei Cheng
- Joshua R Hendrickson
- Junho Choi
- Justin W. Cleary
- Liuyang Sun
- Shangjr Gwo
- Xiaoqin Li
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- National Science and Technology Council
- Robert A. Welch Foundation