Nonlinear optical measurements of CdSiP2 at near and mid-infrared wavelengths

Abstract

We measure the birefringence of the nonlinear optical (NLO) properties of cadmium silicon phosphide via the Z-scan technique at near and mid-infrared wavelengths. We discuss the implications of the NLO properties on optical parametric amplifier performance. We find that the nonlinear absorption does reduce the conversion efficiency, while the nonlinear refraction has a negligible effect.

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 05, 2020
Source ID
10.1364/ome.399516

Entities

People

  • Carl M. Liebig
  • Jamie J. Gengler
  • Kent L. Averett
  • Kevin T. Zawilski
  • Manuel R. Ferdinandus
  • Peter G Schunemann

Organizations

  • Air Force Research Laboratory

Tags

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Semiconductor Device Technology