Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 51-µm laser

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 18, 2015
Source ID
10.1364/ome.5.002835

Entities

People

  • A. Murokh
  • A. Ovodenko
  • B. O’shea
  • E. Arab
  • Igor Pogorelsky
  • J. B. Rosenzweig
  • R. Agustsson
  • R. Tilton
  • V. Solovyov

Organizations

  • Defense Advanced Research Projects Agency

Tags

Technology Areas

  • Directed Energy