Single-pulse, reference-free, spatiospectral measurement of ultrashort pulse-beams

Abstract

High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure.

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 03, 2022
Source ID
10.1364/optica.462586

Entities

People

  • Bojana Ivanic
  • Charles G. Durfee
  • Charles S. Bevis
  • Daniel E Adams
  • David Goldberger
  • David Schmidt
  • Giulia Fulvia Mancini
  • Jonathan Barolak
  • Peter Kazansky
  • Yuhao Lei

Organizations

  • Air Force Office of Scientific Research
  • Colorado School of Mines
  • European Research Council
  • National Science Foundation
  • Nvidia
  • University of Pavia
  • University of Southampton

Tags

Fields of Study

  • Physics

Readers

  • East Asian Political and Security Studies within the Soviet Union
  • Integrated Circuit Design and Technology.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Directed Energy
  • Microelectronics