Accelerated deep self-supervised ptycho-laminography for three-dimensional nanoscale imaging of integrated circuits
Abstract
Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are required: ptychographic to recover the complex transmissivity of the specimen, and rotation of the specimen to acquire multiple projections covering the 3D spatial frequency domain. Two types of rotational scanning are possible: tomographic and laminographic. For flat, extended samples, for which the full 180° coverage is not possible, the latter is preferable because it provides better coverage of the 3D spatial frequency domain compared to limited-angle tomography. It is also because the amount of attenuation through the sample is approximately the same for all projections. However, both techniques are time consuming because of extensive acquisition and computation time. Here, we demonstrate the acceleration of ptycho-laminographic reconstruction of integrated circuits with 16 times fewer angular samples and 4.67 times faster computation by using a physics-regularized deep self-supervised learning architecture. We check the fidelity of our reconstruction against a densely sampled reconstruction that uses full scanning and no learning. As already reported elsewhere [Opt. Express 28, 12872 (2020)OPEXFF1094-408710.1364/OE.379200], we observe improvement of reconstruction quality even over the densely sampled reconstruction, due to the ability of the self-supervised learning kernel to fill the missing cone.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 26, 2023
- Source ID
- 10.1364/optica.492666
Entities
People
- A. F. J. Levi
- George Barbastathis
- Iksung Kang
- Jeffrey A Klug
- Manuel Guizar-sicairos
- Mirko Holler
- Stefan Vogt
- Yi Jiang
Organizations
- Argonne National Laboratory
- Intelligence Advanced Research Projects Activity
- Korea Foundation for Advanced Studies
- Massachusetts Institute of Technology
- Paul Scherrer Institute
- Singapore-MIT Alliance for Research and Technology
- Swiss Federal Institute of Technology in Lausanne
- United States Department of Energy
- University of California, Berkeley
- University of Southern California