Two-Dimensional Perovskite Crystals Formed by Atomic Layer Deposition of CaTiO3 on γ-Al2O3
Abstract
CaTiO3 films with an average thickness of 0.5 nm were deposited onto γ-Al2O3 by Atomic Layer Deposition (ALD) and then characterized by a range of techniques, including X-ray Diffraction (XRD) and High-Resolution, Transmission Electron Microscopy (HRTEM). The results demonstrate that the films form two-dimensional crystallites over the entire surface. Lattice fringes from HRTEM indicate that the crystallites range in size from 5 to 20 nm and are oriented in various directions. Films of the same thickness on SiO2 remained amorphous, indicating that the support played a role in forming the crystallites.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 27, 2021
- Source ID
- 10.3390/nano11092207
Entities
People
- Chao Lin
- John M Vohs
- Ohhun Kwon
- Raymond J Gorte
- Tianyu Cao
Organizations
- Air Force Office of Scientific Research