Flatband voltage stability and time to failure of MOCVD-grown SiO2 and Si3N4 dielectrics on N-polar GaN

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 29, 2019
Source ID
10.7567/1882-0786/ab4d39

Entities

People

  • Chirag Gupta
  • Haoran Li
  • Islam Sayed
  • S. Keller
  • Silvia H Chan
  • Umesh Mishra
  • Wenjian Liu

Organizations

  • Office of Naval Research