Testing Measuring Diag Equip & SE

Abstract

The Marine Corps Automatic Test Equipment Systems (MCATES) program provides development of sustainment technology for automatic test equipment used in organizational/intermediate maintenance facilities. The Marine Corps Family of Automatic Test Systems (ATS), formerly called Third Echelon Test Sets (TETS), provides automatic test program capability for use by technicians both in garrison and the forward edge of the battlefield; specifically in the areas of interactive electronic technical manuals, condition/predictive based maintenance, and embedded sensors and prognostics. Automatic Identification Technology (AIT) devices encompass a variety of read and write data storage technologies that are used to improve accuracy, timeliness, and handling. These technologies provide near-real time Total Asset Visibility data used to influence critical decisions by Operational Commanders. AIT enhances our force in readiness by coordinating, synchronizing and automatically transferring data by means of barcodes, magnetic stripes, integrated circuit cards, optical memory cards, active Radio Frequency Identification (aRFID), and passive RFID (pRFID) tags, as well as the software required to create and manage the devices, read the information stored on them, and integrate that information with other logistics data. The information on each device can range from a single part number to a self-contained database. These devices can be interrogated using a variety of means, including fixed infrastructures and portable systems. The information obtained from those interrogations is provided electronically to various Automated Information Systems (AIS).

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Document Details

Document Type
Project
Publication Date
Oct 01, 2015
Source ID
2929_0206624M_7_1319_PB_2015

Tags

Fields of Study

  • Computer science

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Enterprise Information Systems Architecture and Joint Command Capability Interoperability Support.
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.

Technology Areas

  • Microelectronics

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