Speckle Imaging for Fingerprint Technology
Abstract
This project is researching the use of an optical dual-wavelength speckle imaging technique to capture fingerprints. The Speckle Imaging for Fingerprint Technology (SIFT) enhances ridge details in fingerprints by optically sensing periodic variations in the surface slope in the neighborhood of ridges. SIFT leverages a low-power, eye safe laser beam to scan the finger and detect the ridges. The innovative use of a laser allows for contactless capture of the fingerprint as opposed to traditional fingerprint sensors, which must be in contact with the finger. The outcome of this effort will provide a proof-of-concept for 10 meter stand-off fingerprint capture. Non-contact fingerprint scanning technology will improve force protection at DoD installations by making the process of fingerprint collection and identification faster and easier for the end user while avoiding long lines.
Document Details
- Document Type
- Accomplishment
- Publication Date
- Oct 01, 2013
- Source ID
- 315fe4cad039bd4b57631c95f521e909