Advanced Sources for Single-event Effect Radiation Testing (ASSERT)*
Abstract
*Previously part of Next Generation Microelectronics - Extreme Environment Electronics 3D heterogeneously integrated (3DHI) microelectronics will be a key driver of the next wave in electronics performance. However, the nation's current single-event effect (SEE) radiation testing infrastructure lacks the ability to analyze and qualify emerging 3D devices for operation in high radiation environments. To fill this gap, the Advanced Sources for Single-event Effect Radiation Testing (ASSERT) program will develop new source technologies to create charge tracks with deep penetration depths for SEE qualification of 3DHI topologies and packaging, provide the means to selectively probe device topologies to inform engineering design, and generate data to validate developing models and codes and to provide training sets for optimization.
Document Details
- Document Type
- Accomplishment
- Publication Date
- Oct 01, 2025
- Source ID
- 45f5d43b19ce1aa60f9c7af8f174ca90
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- Root: ELECTRONICS TECHNOLOGY