Electrical-Electronic Equipment Test Set (EEETS)

Abstract

Design and develop the EEETS necessary for production/pre-launch checkout of MOD 7 wafer required for the ongoing test launch program. The program will replace the current unsupportable test set which consists of a non-standard processor, proprietary software, and requires Digital-to-Analog Converter (DAC) cards no longer made (no suitable substitute).

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2012
Source ID
4a365900503518b86e2228f7837cdf95

Tags

Fields of Study

  • Engineering

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Database Systems and Applications
  • Materials Science

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems

Related Documents