Advanced X-Ray Integrated Sources (AXIS)

Abstract

The objective of the Advanced X-Ray Integrated Sources (AXIS) program is to greatly reduce the size, weight and power of tunable X-ray sources while dramatically increasing their electrical efficiency through application of microscale engineering technologies such as MEMS and NEMS. Such imaging modalities should speed reverse engineering of integrated circuits to validate trustworthiness as well as contrast-free battlefield imaging of blood vessel injuries in blunt trauma. The Basic Research component of this effort will focus on defining the fundamental science necessary for the creation of compact and highly efficient synchrotron X-ray sources. These sources may lead to future developments in the tunable imaging field. This program also has efforts funded in PE 0602716E, Project ELT-01.

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2012
Source ID
53723e5232796c169cce64e7ad9c8fb9

Tags

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Materials Science and Engineering.
  • Military Science and Technology Research and Modernization.

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