Integrity Reliability Integrated CircuitS (IRIS)
Abstract
The U.S. military now consumes only approximately one percent of the total integrated circuit (IC) production in the world and increasingly relies on foreign foundry and supplier sources for ICs used within its systems. Given the relatively low consumption, the U.S. military IC requirements are not a factor that can influence IC production or the assurance that parts are delivered as specified. With the majority of ICs used in modern military systems fabricated offshore, this situation presents a potential future risk that the parts acquired will not operate only in the specified manner. The objective of the Integrity and Reliability of Integrated CircuitS (IRIS) program is to develop the technology to derive the functionality of an IC to determine unambiguously if malicious modifications have been made to that IC, and to accurately determine the IC's useful lifespan from a physical perspective. The IRIS program will develop nondestructive scientifically based techniques for full functionality identification and functionality modification detection for ICs utilized in military systems. In addition, the IRIS program will develop innovative test technologies and processes that can determine an IC's useful lifespan based on a significantly reduced number of samples. Once developed, the resulting technologies may be deployed to Government or appropriate organizations that can provide critical IC functionality and reliability inspection services to the DoD, thereby ensuring that a scientific means is available to determine functionality and reliability in the various ICs deployed in DoD systems.
Document Details
- Document Type
- Accomplishment
- Publication Date
- Oct 01, 2013
- Source ID
- 634dfc41e93f5b096cff1f5fcc2fd425