Surface Contamination Monitor

Abstract

A Surface Contamination Monitor (SCM) will allow the end user to quickly survey large areas for alpha-beta contamination. These types of surveys are required by federal, state and Navy regulations prior to releasing an area for unlimited use. SCM technology configurations include proportional detectors or scintillation type detectors. In addition, the SCM automated mapping and report generating features will accelerate these types of radiological surveys. These devices would be used at shipyard facilities by the Naval Nuclear Propulsion Program.

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2024
Source ID
801d716aef125d7266d059e3e0689691

Tags

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Educational Psychology
  • Environmental Engineering.

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