MAJOR THRUST: Future MALD-J concept refinement to characterize the technological feasibility and capability of a future variant utilizing Gallium Nitride (GaN) technology.

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2011
Source ID
911f36bc5eafca0301ce7357f4ac4d72

Tags

Technology Areas

  • Microelectronics

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