RESEARCH ON SEMI-CONDUCTORS AND TRANSISTOR ELECTRONICS

Abstract

Improvements were made which led to more reproducible data from the electrolytic transistor. Experiments were carried out utilizing the chloride- chlorine and the ferrous-ferric couples. It was found that alpha, where alpha = (delta I sub c/delta I sub e) V sub c, is a strong function of the distance of separation of the emitter and collector. Small variations were observed in the resistance of Ge filaments as the ambient atmosphere was cycled between wet and dry O at constant temperature. Measurements were simultaneously taken of the change in contact potential with light. Measurements revealed that photo- conductivity is generally independent of ambient. The P-N junction resistance change was of the order of a factor of 5; the resistance decreased under the influence of wet O and increased under dry O. Preliminary results of ultrasonic experiments on Ge single crystals indicated that the room-temperature logarithmic decrement was about 3 x 10 to the minus power of 5. The value of Young's modulus along the (100) direction decreased linearly with increasing temperature and was 85% of its 25 deg C value at 900 deg C. A strain amplitude of 2.7 x 10 to the minus power of 4 did not break the crystal; up to this strain and at room temperature, Young's modulus was independent of strain amplitude.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 15, 1953
Accession Number
AD0011628

Entities

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplitude
  • Crystals
  • Electrical Engineering
  • Electronics
  • Engineering
  • Friction
  • Germanium
  • Illinois
  • Internal Friction
  • Measurement
  • Melting Point
  • Modulus Of Elasticity
  • Oxygen
  • P-N Junctions
  • Resistance
  • Semiconductors
  • Single Crystals

Readers

  • Analytical Mechanics
  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics