ACCELERATED LIFE TESTING OF METALLIC RECTIFIERS

Abstract

A thermostatically controlled switch was added to the apparatus used for high ambient temperature tests. The stacks will be automatically de- energized in case the ambient temperature rises above the prefixed limit. Investigation of the relationship between the initial characteristics of the stacks and the slope of the curves V output vs time was continued. No significant correlation was apparent. Tests at 1.73 times rated current and 75 deg. C ambient temperature showed very little aging. The aging is uniform in the early period of life, but the individual differences among the stacks later become more pronounced. (See also AD10704)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1953
Accession Number
AD0014184

Entities

People

  • R. G. Gentile

Organizations

  • Rice University

Tags

Communities of Interest

  • C4I
  • Human Systems

DTIC Thesaurus Topics

  • Air Force
  • Cell Size
  • Circuit Breakers
  • Circuits
  • Current Density
  • Electrical Engineering
  • Engineering
  • Engineers
  • Heat Transfer
  • Heat Transfer Coefficients
  • High Acceleration
  • Life Tests
  • Long Life
  • Rectifiers
  • Selenium
  • Test And Evaluation
  • Voltage

Readers

  • Electrical Engineering
  • Mathematics or Statistics
  • Thermal Physics or Thermal Science.