DIFFRACTION OF LONG WAVELENGTH X-RAYS
Abstract
The theory and application are discussed for low angle x-ray diffraction by long wave lengths. The discussion of long-wave diffraction theory includes: the Guinier diffraction theory, mass-scattering and absorption coefficients, multiple scattering and refraction, and packing effects. Four methods are described for obtaining the diffraction pattern: (1) the double- crystal spectrometer; (2) annular slit system; (3) concave mica point-focusing monochromatic; and (4) total-reflection point-focusing system. The design and construction of the latter are described in detail. The method was applied to the measurement of Dow latex particles with 13.3 A AU x-radiation. A diameter of 2760 A was obtained.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1953
- Accession Number
- AD0014705
Entities
People
- Burton Henke
Organizations
- California Institute of Technology