A TEST PROCEDURE FOR SHORT-LIFE RATING OF COMPOSITION RESISTORS

Abstract

A short-life rating procedure is given for abnormal operation of composition resistors. Consideration was given to high ambient temperature, altitude, load, humidity, and vibration. Details of equipment, methods of measurement, and mounting of samples are described. The rating procedure utilizes sequential sampling, pre-conditioning of resistors, and statistical treatment of the data. Theoretical and experimental considerations leading to the procedure are given. The applicability of the rating procedure to other electronic components is indicated.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1953
Accession Number
AD0018756

Entities

People

  • D. B. Bridges
  • J. H. Graham
  • W. T. Sackett Jr

Organizations

  • Battelle Memorial Institute

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Human Systems
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Air Force Facilities
  • Carbon Resistors
  • Climate Change
  • Confidence Limits
  • Electronic Components
  • Film Resistors
  • High Temperature
  • Life Tests
  • Measurement
  • Sea Level
  • Standards
  • Surface Temperature
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Readers

  • Aerospace Test and Evaluation
  • Regression Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems