AN INVESTIGATION OF SOME PROPERTIES OF COLD CATHODE DIODES
Abstract
Some properties of cold cathode diodes manufactured by the General Electric Company for use in the XR-8 Fuze circuit have been examined. Tests have been conducted on breakdown voltage characteristics of the diodes using a variety of test methods, and the effects of repeated breakdowns examined. Energy transfer characteristics of the diodes have been studied, with emphasis on the effect of the magnitude of the applied voltage, and also the dynamic voltage drop characteristics. In the course of the experiments a new test set for measuring breakdown voltage, the Dynamic Breakdown Voltage Tester, has been introduced with significant results, the most important of which is the reproducibility obtainable in contrast with previous confusion on this point. Tests have been conducted on two major modifications of the basic design: a self-shielded diode, and a rugged short body - short electrode version. The results indicate that the modified versions are not applicable in the XR-8 Fuze because of the necessity for design changes in the fuze structure, which is now in an advanced stage of development. The modifications, however, do appear to have excellent properties for other applications, such as timing circuits and high acceleration requirements. The Dynamic Breakdown Voltage Tester had also been used to study the breakdown voltage properties dependent on the rate of voltage application, with the results indicating that breakdown voltage increases with increase in voltage-time gradient of the applied voltage.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 13, 1953
- Accession Number
- AD0021330
Entities
People
- Julius I. Bowen
Organizations
- Naval Ordnance Laboratory