SOME METHODS FOR OPTICAL STUDIES OF POLYMER STRUCTURE

Abstract

This report includes Measurement of Birefringence of Biaxially Oriented Films, by Richard S. Stein; and Scattering of Light by Thin Polymer Films. Part IV. An Apparatus for Measurement of Scattering at Very Low Angles, by Alphonse Plaza, Forrest H. Norris, and Richard S. Stein.

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1957
Accession Number
AD0135143

Entities

People

  • Alphonse Plaza
  • Forrest H. Norris
  • Richard S. Stein

Organizations

  • University of Massachusetts Amherst

Tags

DTIC Thesaurus Topics

  • Birefringence
  • Films
  • Low Angles
  • Macromolecules
  • Measurement
  • Molecules
  • Polymeric Films
  • Polymers
  • Scattering

Fields of Study

  • Physics

Readers

  • Military History
  • Nanofabrication and Microfabrication.
  • Spectroscopy.