Analog Techniques for Measuring the Frequency Response of Linear Physical Systems Excited by Frequency-Seep Inputs
Abstract
Data-reduction methods using general-purpose analog computer equipment and compatible testing techniques for determining the frequency response of linear physical systems are examined. The techniques considered may be classed as steady state or transient depending on the method of excitation. The relative merits of periodic, slow sweep, and transient (rapid sweep) forcing functions are discussed and applications are given that relate to dynamic-response tests of aeroelastic systems. Two frequency-sweep-input methods are considered in detail. In one case the sweep rate is sufficiently slow that the response is approximately the same as that for steady-state conditions. With this input the frequency response can be evaluated and displayed in real time while the test is in progress. Errors due to treating sweep data as steady state can be eliminated, when desired, by reanalyzing tape-recorded time histories of the input and output as transient rather than as periodic data. In the second method the frequency-response function is determined from the system's transient response to a very rapid sweep input. The purpose of frequency sweep in this case is to provide sufficient harmonic content in the input to overcome noise while keeping the test time as short as possible. On the basis of simulated forced-response tests and limited flight-test data presented herein, it appears that a transient-type rapid-sweep forcing function offers a considerable saving in test time while preserving the accuracy possible with steady-state sinusoidal inputs.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1960
- Accession Number
- AD0244012
Entities
People
- Albert W. Hall
- Lawrence E. Barker Jr.
- Wilmer H. Reed Iii
Organizations
- National Aeronautics and Space Administration