A RADIATION TECHNIQUE FOR THE MEASUREMENT OF THERMAL CONDUCTIVITY OF SEMICONDUCTORS BETWEEN 1000 AND 2000 C

Abstract

AFTER A STUDY OF ALTERNATIVE METHODS OF SUPPLYING RADIATION ENERGY TO THE SAMPLE, AN EXPERIMENTAL TECHNIQUE WHICH RELIES ON HEATING THE SAMPLE WITH THERMAL RADIATION AT ONE END AND MEASURING THE ENERGY RERADIATED AT THE OTHER END HAS BEEN SELECTED. IN THE APPARATUS, SEMICONDUCTOR SAMPLES OF SUITABLE DIMENSIONS ARE EXPOSED TO THE HIGH HEATFLUX WHICH CAN BE OBTAINED IN AN ELECTRIC ARE IMAGING FURNACE. THE ABSOLUTE TEMPERATURE OF THE SAMPLE IS MEASURED BY MEANS OF AN OPTICAL PYROMETER, WHICH IS ALSO USED TO MEASURE THE TEMPERATURE PROFILES ON THE TWO SAMPLE FACES. DEVELOPMENT WORK WAS CONCERNED WITH (1) ESTABLISHING THE PERFORMANCE CHARACTERISTICS OF THE IMAGING FURNACE, (2) MEASURING THE RADIANT ENERGY CONCENTRATED ON THE SAMPLE, (3) THE DESIGN AND CONSTRUCTION OF THE THERMAL CONDUCTIVITY APPARATUS, (4) THE INSTRUMENTATION, AND (5) CALCULATING PROCEDURES SUITABLE FOR EVALUATING THERMAL CONDUCTIVITY. THE DEVELOPMENT OF THE THERMAL CONDUCTIVITY MEASUREMENT TECHNIQUE IS DISCUSSED

Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1960
Accession Number
AD0250446

Entities

Organizations

  • Arthur D. Little

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Conductivity
  • Instrumentation
  • Measurement
  • Measuring Instruments
  • Optical Pyrometers
  • Pyrometers
  • Radiation
  • Semiconductors
  • Thermal Conductivity
  • Thermal Radiation

Fields of Study

  • Physics

Readers

  • Systems Analysis and Design
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics