TECHNIQUES FOR PULSE TESTING MAGNETIC FILM MEMORY ELEMENTS
Abstract
Equipment and procedures have been developed for testing the individual magnetic film elements of an integral array. Each element is tested for switching output amplitude, digit and transverse disturb sensitivity, and skew of the easy axis. The array of magnetic film elements is mechanically indexed under a single set of drive lines and sense coil, one element being tested at a time. The individual components of a testing station, manipulator, drive lines and sense coil, pulse generators, pattern generating logic, and sense amplifier are described. The pulse testing equipment was constructed for testing 16 x 16 arrays of 1/16-in.-diam. elements on 0.100-in. centers. It has also been used, successfully, for testing individual 0.010-in.-diam. elements on 0.100-in. centers. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 29, 1960
- Accession Number
- AD0255698
Entities
People
- Allan H. Andersson
- Thomas S. Crowther
Organizations
- Massachusetts Institute of Technology