A RADIATION TECHNIQUE FOR THE MEASUREMENT OF THERMAL CONDUCTIVITY OF SEMICONDUCTORS BETWEEN 1000 AND 2000 C
Abstract
A summary is given of the experimental and analytical work performed on the measurement of the thermal conductivity of semiconductors between 1000 and 2000 C. Details are given of the apparatus constructed to perform the tests, the experimental procedures developed for carrying out thermal-conductivity tests, methods for measuring temperatures and heat fluxes, calibration procedures, error analysis, thermal-conductivity calculation procedures, results, and future plans. The following conclusions were reached: (1) the method is feasible and reproducible, yielding thermal-conductivity data accurate to within + or - 10% for opaque materials; (2) thermal-conductivity measurements can be carried out to temperature levels in excess of those achieved in the present work; (3) each test run takes less than 10 min, and a calculation of thermal conductivity from the test data can be accomplished with a computer cost of less than $10 a point; and (4) the method for measuring thermal conductivity can be extended to materials that have to be exposed in a vacuum or a controlled atmosphere, and which exhibit non-isotropic heat-flow characteristics, or to materials that are semitransparent to radiation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 31, 1961
- Accession Number
- AD0255931
Entities
People
- Peter E. Glaser
- Sabino Merra
Organizations
- Arthur D. Little