CONCERNING THE DEPTH OF PENETRATION OF MEDIUM-ENERGY IONS INTO A SUBSTANCE

Abstract

Research concerns measuring the depth of penetration of cesium ions of 4 kiloelectron volts (Kev) energy into germanium. The labeled atom process was used for the purpose of determining the depth of penetration. The curves showing the relationship between the activity of the irradiated samples and the time of etching, taken for a series of samples, in general had anANALOGOUS CHARACTER FOR ALL THE SAMPLES. On the average, the decrease of activity was such, that after one minute of etching, it comprised 66% of initial activity, after two minutes 56%, after three minutes 48%, after four minutes 40%, after five minutes 34%, and after six minutes 24%. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 09, 1960
Accession Number
AD0256108

Entities

People

  • M.m. Bredov
  • N.m. Okuneva

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Behavior And Behavior Mechanisms
  • Elements
  • Germanium
  • Group 14 Elements
  • Personality

Readers

  • Nuclear and Radiation Engineering.
  • Thin Film Deposition Science.