HANDBOOK OF INSTRUCTIONS FOR TEST SET, DIODE SEMICONDUCTOR DEVICE QRC-133A(T)

Abstract

Operation and maintenance instructions are presented for test set, diode semiconductor device QRC-133A(T). The test set was developed to enable maintenance personnel to test the forward and inverse voltage/current characteristics of diode semiconductor devices. The test set electronically consists of a power transformer with a 115-VAC primary winding and two secondary windings. Also incorporated are: (1) a variable transformer that permits increasing or decreasing the diode test voltage, (2) switching circuitry that permits testing diodes with a maximum current handling capability of 1.0 ampere or 10 amperes, (3) a switch that orients the diode for forward or reverse test conditions, (4) a power ON-OFF switch, and (5) an interlock switch that prevents the application of test voltage unless the diode compartment cover is closed. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 10, 1961
Accession Number
AD0256264

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Electronics
  • Handbooks
  • Instructions
  • Maintenance
  • Maintenance Personnel
  • Power Transformers
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Switches
  • Switching
  • Test Sets
  • Transformers

Readers

  • Electrical Engineering
  • Electronics Engineering
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems