INDUSTRIAL PREPAREDNESS STUDY. RUGGEDIZED AUDIO TRANSISTORS
Abstract
Effort was devoted to the resolution of difficulties encountered in manufacturing the 2N668 ruggedized audio transistor. It was discovered that contamination had been building up in the alloying furnaces, causing injecting base contacts. Elimination of this condition greatly improved electrical results at final testing. Increased rinsing after etching and improvements in the method of post-etch electrical testing produced improved results with less etching required. While the experiments have proved fruitful, the necessary devices to complete the pilot run have not yet been completely fabricated. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 28, 1961
- Accession Number
- AD0256568
Entities
People
- G.t. Demoss
- L.d. Jr. Emery