DEVELOPMENT AND EVALUATION OF A HIGH TEMPERATURE DIELECTRIC MATERIAL FOR CAPACITORS

Abstract

The ceramic compounds investigated were BaZrO3, LaAlO3 and La2Ti2O7 modified by the following partial cationic substitutions: Ba(2+) by La(3+), Zr(4+) and Ti(4+) by Nb(5+) and Al(3+) by Si(4+). Among these compounds (Ba.97La.02)ZrO3, (Ba.94La.04)ZrO3, and (Ba.91La.06)ZrO3 had the best dielectric properties. At 350 C, heir dielectric constants were about 36, Q values were 400 or greater, volume resistivities were about 5 x 10 to the 9th power ohm-meters, and (RC) products far in excess of 1 megohm-microfarad. The change of dielectric constant from 23 to 250 C was about -4%. Life tests lasting 1000 hr were carried out on 0.010-in.-thick wafers at 250 C, 350 C and 500 C at 60 v dc/mil. The final (RC)-products ranged at 250 C from 1400-6500 megohm-microfarad and at 350 C from 100 - 140 megohm-microfarad. At 500 C the test samples deteriorated by partial reduction and electrode diffusion. Very high dielectric strength was observed at 105 C. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 14, 1961
Accession Number
AD0256750

Entities

People

  • John Koenig

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitors
  • Dielectric Permittivity
  • Dielectric Properties
  • Dielectric Strength
  • Dielectrics
  • Diffusion
  • Electrical Properties
  • Electricity
  • Electrodes
  • High Temperature
  • Life Tests
  • Materials
  • Test And Evaluation

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Metallurgy
  • Thin Film Deposition Science.